Yield/Characterization

2025-Product Design Enhancement with Test Structures for Non-Contact Detection of Yield Detractors

2025-The Overview of Silicon Carbide Technology: Status, Challenges, Key Drivers, and Product Roadmap

2025-Full-chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

EDTM 2022 – Novel E-beam Techniques for Inspection and Monitoring

EDTM 2022 – New Method for BEOL Overlay and Process Margin Characterization

NANOTS 2021 – Advanced High Throughput e-Beam Inspection with DirectScan

IEEE S3S 2019 – Characterization Challenges and Solutions for FDSOI Technologies

IEEE JEDS 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

EDTM 2019 – Yield and Reliability Challenges at 7nm and Below

EDTM 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories