Plano, Texas, USA, 08 December 2021 – Siemens Digital Industries Software has today announced a new collaboration with PDF Solutions, Inc. (NASDAQ: PDFS), a global provider of differentiated data and analytics solutions to the semiconductor and electronics industries, to develop a comprehensive solution that transforms integrated circuit (IC) test and yield analysis data from Siemens’ Tessent™ software into actionable intelligence. For mutual customers, this intelligence can dramatically boost manufacturing yields and accelerate time to market for new products.
Siemens’ Tessent™ software for IC test and diagnosis has a long track record of helping many of the world’s most successful IC design firms enhance yield and improve quality by generating root cause defect data based on automated design analysis and end-of-line test data. However, yield challenges extend beyond IC design into manufacturing and other IC lifecycle phases, each of which produce their own categories and classes of yield data.
The new enhancements of Siemens’ and PDF Solutions’ products are planned to work together to deliver a comprehensive solution that aggregates and analyzes design-based, yield relevant data from Siemens’ Tessent software, together with a broad array of other yield data sources, to rapidly analyze and identify yield correlations that are otherwise undetectable quickly, and in some cases automatically.