Advantest Voice

VOICE, the annual Advantest Developer Conference, is the leading conference for the growing international community of users and strategic partners involved with Advantest’s V93000 and T2000 SoC test platforms as well as Advantest memory testers, handlers and test cell solutions, product engineering, and test technology.

74-PT – Intelligent Dynamic Parametric Testing with the V93000/SMU8 + PDF Exensio® Test Operations

The primary objective of parametric testing is to identify wafer-fabrication deviations at the earliest possible time. In a unique application of dynamic adaptive test, this paper demonstrates how parametric test flows can be automatically modified at test time to analyze problems, generate additional parametric process information and perform the first level of device characterization analysis while optimizing parametric test cell utilization.