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Learn About Exensio at ITC, Anaheim - October 6-8, 2015

Aug 18, 2015

PDF is excited to showcase the latest developments in our state-of-the art big data analysis platform – Exensio – at ITC, the upcoming International Test Conference at the Disneyland Hotel. Come learn how the Exensio platform is expanding even further across the product lifecycle, now including test and assembly solutions as well as cloud-based production and yield analysis.

Visit us at booth #411 for demos and product information. And attend our presentation at the Corporate Forum on October 6 at 1pm to learn how customers are harnessing PDF Solutions’ technology to reap the benefits of higher yields, improved productivity at test and assembly, faster time-to-market, and reduced product and process variability.

What:

International Test Conference (ITC)

Where:

Disneyland Hotel
Anaheim, CA, booth #411

When:

October 6-8, 2015

Schedule of Events:

 Day

 Time

 Location

 Company 

 Presenter

 Title

 Tuesday   1:00
 p.m. 
 Corporate 
 Forum
 
 PDF  Ken Harris
"Using Big Data Infrastructure to Drive Yield Improvement and Test Productivity Across the Product Lifecycle"
 Tuesday
 1:30
 p.m.
 PDF Booth 411
 Peregrine
 Ryan Chapman "The Test and Yield Solution at Peregrine"
 Wednesday 
 10:30
 a.m. 
 PDF Booth 411  PDF  Edward Yang
Exensio Platform Overview
 Wednesday
 11:30
 a.m.
 PDF Booth 411  PDF  Brian Graff
"Exensio-Hosted for Fast Monitoring and Control of Assembly and Test Operations"
 Wednesday
 12:30
 p.m.
 PDF Booth 411  PDF  Jason Arp
"Analysis and Productivity Improvement using Exensio-Test Dashboards"
 Wednesday
1:00
 p.m.
 PDF Booth 411  PDF  Jason Arp
"Exensio:  Test Floor Opitmization and Control"
 Wednesday
1:30
 p.m.
 PDF Booth 411  Tessolve  Tessolve CEO, P. Raja Manickam
"NPI cycle time reduction through Data Analytics"
 Wednesday
 3:45
 p.m.
 PDF Booth 411  PDF  PDF Staff
Enjoy drinks and conversation with PDF staff and clients.
 Thursday  11:00
 a.m.
 PDF Booth 411  PDF  Edward Yang
Exensio Platform Overview
 Thursday  12:00
 p.m.
 PDF Booth 411  Semtech  David Greenwood
"Exensio : Real Time Monitoring & Data Cleansing"
 Thursday  1:00
 p.m.
 PDF Booth 411  PDF  Craig Jackson
"Automated Test probe route optimization for test time reduction"
 Thursday  4:40
 p.m.
 IEEE Workshop on Defect and Adaptive Test  Analysis  PDF  PDF CEO, John Kibarian
Workshop keynote address on yield learning.

 

Thank you for your continued interest in our products and services. Please contact us with any questions at info@pdf.com