Rich Semiconductor Capabilities Delivered On an Easy-To-Use Analytics Platform
The Exensio-Yield data analysis product (formerly called dataPOWER® VSF) enables IC manufacturers to rapidly identify losses due to problems in fabrication, test and design. It spans data types generated across the entire organization — including yield data, process tool data, manufacturing data and many others. Engineers and analysts can effectively drill-down to root causes and take quick actions to improve key performance metrics. These solutions feature a high-performance fully integrated database, the most comprehensive set of analysis engines available, intuitive easy-to-use interfaces for interactive analysis and a user-customizable automation and web reporting system. Our engineering data analysis product has been developed to cover the spectrum of users’ needs - from novice analysts to power users.
Benefits of Exensio-Yield include:
- Higher, more stable yields
- Faster time-to-market
- Reduced scrap
- More consistent, optimized test
- Increased engineering productivity
Exensio-Yield is a powerful yield analysis solution for IC producers, featuring an intuitive interface, strong visualization capabilities and the ability to handle large data volumes.
Drill-down from Bin map lot gallery to composite map & Parametric Fail Pareto for selected Lot(s)
PDF Solutions couples these advanced software solutions with knowledgeable, hands-on support engineers to maximize our clients’ results.
Contact us to discover more about how PDF Solutions can address your critical issues throughout the IC manufacturing process life cycle.